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JETP, Vol. 62, No. 5, p. 976 (November 1985)
(Russian original - ZhETF, Vol. 89, No. 5, p. 1692, November 1985 )

Energy gaps and the role of disorder under conditions of fractional quantization of the Hall resistance in silicon metal-oxide-semiconductor structures
I.V. Kukushkin, V.B. Timofeev

Received: March 28, 1985

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