JETP, Vol. 62,
No. 5,
p. 976 (November 1985)
(Russian original - ZhETF,
Vol. 89,
No. 5,
p. 1692,
November 1985
)
Energy gaps and the role of disorder under conditions of fractional quantization of the Hall resistance in silicon metal-oxide-semiconductor structures
I.V. Kukushkin, V.B. Timofeev
Received: March 28, 1985
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Golden Pages
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