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ZhETF, Vol. 66, No. 4, p. 1469 (October 1974)
(English translation - JETP, Vol. 39, No. 4, p. 721, October 1974 )

The issue content is only available in english translation.

lnvestigation of the properties of the dislocation EPR spectra in silicon
S.V. Broude, V.A. Grazhulis, V.V. Kveder, Yu. A. Osip'yan

Received: November 25, 1973

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