Journal of Experimental and Theoretical Physics
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JETP, Vol. 81, No. 2, p. 363 (August 1995)
(Russian original - ZhETF, Vol. 108, No. 2, p. 669, August 1995 )

Investigation of the structure of porous silicon using second harmonic generation and atomic force microscopy
A.V. Mel'nikov, Yu. N. Moiseev, T.V. Murzina

Received: August 23, 1994

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