JETP, Vol. 81,
No. 2,
p. 363 (August 1995)
(Russian original - ZhETF,
Vol. 108,
No. 2,
p. 669,
August 1995
)
Investigation of the structure of porous silicon using second harmonic generation and atomic force microscopy
A.V. Mel'nikov, Yu. N. Moiseev, T.V. Murzina
Received: August 23, 1994
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