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JETP, Vol. 53, No. 3, p. 618 (March 1981)
(Russian original - ZhETF, Vol. 80, No. 3, p. 1206, March 1981 )

Investigation of dislocations in silicon by the photo-ESR method
V.V. Kveder, Yu. A. Osip'yan

Received: July 31, 1980

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