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JETP, Vol. 40, No. 3, p. 570 (February 1975)
(Russian original - ZhETF, Vol. 67, No. 3, p. 1148, February 1975 )

Investigation of the nature of the diode effect on dislocations in silicon
V.G. Eremenko, V.I. Nikitenko, E.B. Yakimov

Received: April 9, 1974

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